The "shelf life" of new energy crown spring contact refers to the storage time under certain environmental conditions from the completion of production and inspection to the time before installation, and the effective storage period of new energy crown spring contact refers to the quality of the new energy crown spring contact during the storage period And reliability is the time period during which the equipment requirements can be met before installation. The basic validity period refers to the effective storage period without considering the quality level of the new energy crown spring contact.

The new energy crown spring contact is composed of two parts of different materials: plastic insulation parts and hardware parts with different plating. The storage period of plastic and metal is different. A complete product storage period should be based on the fastest aging parts. Under normal circumstances, the life of insulators is 3 years, but due to different storage environments, there is a big difference.

Discrete semiconductor devices over 12 months need to be re-inspected when they are delivered. Therefore, it can be considered that the effective storage period of discrete semiconductor devices is 12 months. The later released version stipulates that semiconductor discrete devices older than 24 months need to be re-inspected upon delivery; the new version released later stipulates that semiconductor discrete devices that have a "backlog" of more than 36 months need to be re-inspected upon delivery. .

In short, the "shelf life" of new energy crown spring contact is very long, but the effective storage period is not long. Under the condition of good temperature and humidity control, the life span can reach 3 years. If the environment is bad, the terminal life span is only one and a half years or even shorter. , The strong acid-base environment can cause great damage to the terminals, so it is necessary to conduct regular product inspections, and immediately replace the new energy crown spring contact when the aging phenomenon is found.